• Bevel polishing monitor sensor system.
• Using Nitrogen Si film absorption wave length around 658nm and non-absorbent wave length 780nm to monitor nitrogen film polishing extant system.

Light projecting system

• ・Absorption wave length: 658nm
• ・Non-absorbent wave length: 785nm
• ・Loaded with two wavelength composition module.
  • ・Fiber collimator loaded inside of this product for light projection or receiving.

For light receiving

• ・Laser guide fiber(100×150×bundled 6 fiber)(Constitute a concentric same as light projecting system)
• ・Two wavelength demultiplexing model
• ・675nm photometry/Electric converter(Output power:0~5V)
• ・785nm photometry/Electric converter(Output power:0~5V)

• ◆Two each different frequency signal combined to SM and emits 2 wavelength from one fiber
• ◆Receiving reflected light by 6 fiber(200μ) and demultiplexing to 650nm/780nm to monitoring each reflected light
•    The reflected light will electric conversion and output such a BNC connector
• ◆It is attached temperature controller
• ◆It is possible to use as SM light source device by connect with SM fiber
• ◆The light-receiving sensitivity can adjust by attached volume as you needed
• ◆You can setup wavelength optionally